WebNov 24, 2024 · Advanced Design For Test(DFT) techniques provides efficient test solutions to deal with higher test cost, higher power consumption, test area, and pin count at lower geometries by improving the controllability and observability of the sequential flops. In turn, this improves the yield on SoC. Reliability and testability are important factors in today's … WebOct 8, 2024 · Hierarchical DFT enables another benefit to the design flow by “shifting left.” This is code for getting out of the way of tapeout. A flat DFT methodology delays too much DFT work until after the full-chip netlist is verified, placing it squarely in the critical path to tapeout. Any late changes to the netlist means restarting the ATPG process.
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A Practical Approach To DFT For Large SoCs And AI Architectures, Part I
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